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Record 47 mV/dec top-down vertical nanowire InGaAs/GaAsSb tunnel FETs

dc.contributor.authorAlian, AliReza
dc.contributor.authorEl Kazzi, Salim
dc.contributor.authorVerhulst, Anne
dc.contributor.authorMilenin, Alexey
dc.contributor.authorPinna, Nicolo
dc.contributor.authorIvanov, Tsvetan
dc.contributor.authorLin, Dennis
dc.contributor.authorMocuta, Dan
dc.contributor.authorCollaert, Nadine
dc.date.accessioned2021-10-25T16:32:14Z
dc.date.available2021-10-25T16:32:14Z
dc.date.issued2018
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/30108
dc.sourceIIOimport
dc.titleRecord 47 mV/dec top-down vertical nanowire InGaAs/GaAsSb tunnel FETs
dc.typeProceedings paper
dc.contributor.imecauthorAlian, AliReza
dc.contributor.imecauthorVerhulst, Anne
dc.contributor.imecauthorMilenin, Alexey
dc.contributor.imecauthorPinna, Nicolo
dc.contributor.imecauthorIvanov, Tsvetan
dc.contributor.imecauthorLin, Dennis
dc.contributor.imecauthorCollaert, Nadine
dc.contributor.orcidimecVerhulst, Anne::0000-0002-3742-9017
dc.contributor.orcidimecMilenin, Alexey::0000-0003-0747-0462
dc.contributor.orcidimecPinna, Nicolo::0000-0003-3392-0324
dc.contributor.orcidimecIvanov, Tsvetan::0000-0003-3407-2742
dc.contributor.orcidimecCollaert, Nadine::0000-0002-8062-3165
dc.date.embargo9999-12-31
dc.source.peerreviewyes
dc.source.beginpage133
dc.source.endpage134
dc.source.conferenceIEEE Symposium on VLSI Technology
dc.source.conferencedate18/06/2018
dc.source.conferencelocationHonolulu, HI USA
dc.identifier.urlhttps://ieeexplore.ieee.org/document/8510619
imec.availabilityPublished - open access


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