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Detailed characterisation of Si Gate-All-Around Nanowire MOSFETs at cryogenic temperatures
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Detailed characterisation of Si Gate-All-Around Nanowire MOSFETs at cryogenic temperatures
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Date
2018
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Boudier, Dimitri
;
Cretu, Bogdan
;
Simoen, Eddy
;
Veloso, Anabela
;
Collaert, Nadine
Journal
Solid-State Electronics
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1913
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Acq. date: 2026-01-08
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Views
1913
since deposited on 2021-10-25
2
last month
Acq. date: 2026-01-08
Citations