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Performance degradation of InGaAs/AlInAs HEMT's under thermal stress

dc.contributor.authorvan der Zanden, Koen
dc.contributor.authorSchreurs, Dominique
dc.date.accessioned2021-10-01T09:14:27Z
dc.date.available2021-10-01T09:14:27Z
dc.date.issued1998
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/3033
dc.sourceIIOimport
dc.titlePerformance degradation of InGaAs/AlInAs HEMT's under thermal stress
dc.typeProceedings paper
dc.contributor.imecauthorSchreurs, Dominique
dc.date.embargo9999-12-31
dc.source.peerreviewno
dc.source.beginpage33
dc.source.endpage34
dc.source.conferenceProceedings of the 8th European Heterostructure Technology Workshop - HETECH '98
dc.source.conferencedate13/09/1998
dc.source.conferencelocationCardiff UK
imec.availabilityPublished - open access


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