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Combined AFM and ToF-SIMS analyses for the study of filaments in organic resistive switching memories

dc.contributor.authorBusby, Yan
dc.contributor.authorFranquet, Alexis
dc.contributor.authorSpampinato, Valentina
dc.contributor.authorCasula, Giulia
dc.contributor.authorBonfiglio, Annalisa
dc.contributor.authorCosseddu, Piero
dc.contributor.authorPireaux, Jean-Pireaux
dc.contributor.authorHoussiau, Laurent
dc.date.accessioned2021-10-25T16:59:55Z
dc.date.available2021-10-25T16:59:55Z
dc.date.issued2018
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/30345
dc.sourceIIOimport
dc.titleCombined AFM and ToF-SIMS analyses for the study of filaments in organic resistive switching memories
dc.typeProceedings paper
dc.contributor.imecauthorFranquet, Alexis
dc.contributor.imecauthorSpampinato, Valentina
dc.contributor.orcidimecFranquet, Alexis::0000-0002-7371-8852
dc.contributor.orcidimecSpampinato, Valentina::0000-0003-3225-6740
dc.source.peerreviewyes
dc.source.beginpage1073814
dc.source.conferenceOrganic and Hybrid Sensors and Bioelectronics XI
dc.source.conferencedate19/08/2018
dc.source.conferencelocationSan Diego, CA USA
dc.identifier.urlhttps://doi.org/10.1117/12.2319923
imec.availabilityPublished - imec
imec.internalnotesProceedings of SPIE; Vol. 10738


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