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Evidence of TiOx reduction at the SiOx/TiOx interface of passivating electron-selective contacts

dc.contributor.authorCho, Jinyoun
dc.contributor.authorDebucquoy, Maarten
dc.contributor.authorRecaman Payo, Maria
dc.contributor.authorSchapmans, Elie
dc.contributor.authorGordon, Ivan
dc.contributor.authorSzlufcik, Jozef
dc.contributor.authorPoortmans, Jef
dc.date.accessioned2021-10-25T17:14:34Z
dc.date.available2021-10-25T17:14:34Z
dc.date.issued2018
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/30414
dc.sourceIIOimport
dc.titleEvidence of TiOx reduction at the SiOx/TiOx interface of passivating electron-selective contacts
dc.typeProceedings paper
dc.contributor.imecauthorCho, Jinyoun
dc.contributor.imecauthorDebucquoy, Maarten
dc.contributor.imecauthorRecaman Payo, Maria
dc.contributor.imecauthorGordon, Ivan
dc.contributor.imecauthorSzlufcik, Jozef
dc.contributor.imecauthorPoortmans, Jef
dc.contributor.orcidimecDebucquoy, Maarten::0000-0001-5980-188X
dc.contributor.orcidimecGordon, Ivan::0000-0002-0713-8403
dc.contributor.orcidimecPoortmans, Jef::0000-0003-2077-2545
dc.date.embargo9999-12-31
dc.source.peerreviewyes
dc.source.beginpage40005
dc.source.conferenceSiliconPV: 8th International Conference on Crystalline Silicon Photovoltaics
dc.source.conferencedate19/03/2018
dc.source.conferencelocationLausanne Switzerland
dc.identifier.urlhttps://aip.scitation.org/doi/10.1063/1.5049268
imec.availabilityPublished - open access
imec.internalnotesAIP Conference Proceedings; Vol. 1999


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