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A physically unclonable function featuring 0% BER using soft oxide breakdown positions in 40nm CMOS

dc.contributor.authorChuang, Kent
dc.contributor.authorBury, Erik
dc.contributor.authorDegraeve, Robin
dc.contributor.authorKaczer, Ben
dc.contributor.authorLinten, Dimitri
dc.contributor.authorVerbauwhede, Ingrid
dc.date.accessioned2021-10-25T17:16:32Z
dc.date.available2021-10-25T17:16:32Z
dc.date.issued2018
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/30422
dc.sourceIIOimport
dc.titleA physically unclonable function featuring 0% BER using soft oxide breakdown positions in 40nm CMOS
dc.typeProceedings paper
dc.contributor.imecauthorChuang, Kent
dc.contributor.imecauthorBury, Erik
dc.contributor.imecauthorDegraeve, Robin
dc.contributor.imecauthorKaczer, Ben
dc.contributor.imecauthorLinten, Dimitri
dc.contributor.orcidimecBury, Erik::0000-0002-5847-3949
dc.contributor.orcidimecKaczer, Ben::0000-0002-1484-4007
dc.contributor.orcidimecLinten, Dimitri::0000-0001-8434-1838
dc.date.embargo9999-12-31
dc.source.peerreviewyes
dc.source.beginpage157
dc.source.endpage160
dc.source.conferenceAsian Solid State Circuits Conference - A-SSCC
dc.source.conferencedate5/11/2018
dc.source.conferencelocationTainan Taiwan
dc.identifier.urlhttps://ieeexplore.ieee.org/document/8579252
imec.availabilityPublished - open access


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