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Modeling 1/f noise and extraction of the SPICE noise parameters using a new extraction procedure

dc.contributor.authorVan Heijningen, Marc
dc.contributor.authorVandamme, Ewout
dc.contributor.authorDeferm, Ludo
dc.contributor.authorVandamme, Lorenz
dc.date.accessioned2021-10-01T09:16:54Z
dc.date.available2021-10-01T09:16:54Z
dc.date.issued1998
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/3042
dc.sourceIIOimport
dc.titleModeling 1/f noise and extraction of the SPICE noise parameters using a new extraction procedure
dc.typeProceedings paper
dc.contributor.imecauthorDeferm, Ludo
dc.source.peerreviewno
dc.source.beginpage468
dc.source.endpage471
dc.source.conferenceProceedings of the 28th European Solid-State Device Research Conference - ESSDERC'98; 8-10 Sept. 1998; Bordeaux, France.
dc.source.conferencelocation
imec.availabilityPublished - imec


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