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Multifractal analysis of line-edge roughness

dc.contributor.authorCostantoudis, Vassilios
dc.contributor.authorPapaverios, George
dc.contributor.authorLorusso, Gian
dc.contributor.authorRutigliani, Vito
dc.contributor.authorVan Roey, Frieda
dc.contributor.authorGogolides, Evangelos
dc.date.accessioned2021-10-25T17:28:08Z
dc.date.available2021-10-25T17:28:08Z
dc.date.issued2018
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/30470
dc.sourceIIOimport
dc.titleMultifractal analysis of line-edge roughness
dc.typeProceedings paper
dc.contributor.imecauthorLorusso, Gian
dc.contributor.imecauthorVan Roey, Frieda
dc.date.embargo9999-12-31
dc.source.peerreviewyes
dc.source.beginpage1058534
dc.source.conferenceMetrologia, Inspection, and Process Control for Microlithography XXXII
dc.source.conferencedate25/02/2018
dc.source.conferencelocationSan Jose, CA USA
dc.identifier.urlhttps://doi.org/10.1117/12.2306508
imec.availabilityPublished - open access
imec.internalnotesProceedings of SPIE; Vol. 10585


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