dc.contributor.author | Croes, Kristof | |
dc.contributor.author | Adelmann, Christoph | |
dc.contributor.author | Wilson, Chris | |
dc.contributor.author | Zahedmanesh, Houman | |
dc.contributor.author | Varela Pedreira, Olalla | |
dc.contributor.author | Wu, Chen | |
dc.contributor.author | Lesniewska, Alicja | |
dc.contributor.author | Oprins, Herman | |
dc.contributor.author | Beyne, Sofie | |
dc.contributor.author | Ciofi, Ivan | |
dc.contributor.author | Kocaay, Deniz | |
dc.contributor.author | Stucchi, Michele | |
dc.contributor.author | Tokei, Zsolt | |
dc.date.accessioned | 2021-10-25T17:29:12Z | |
dc.date.available | 2021-10-25T17:29:12Z | |
dc.date.issued | 2018 | |
dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/30474 | |
dc.source | IIOimport | |
dc.title | Interconnect metals beyond copper: reliability challenges and opportunities | |
dc.type | Proceedings paper | |
dc.contributor.imecauthor | Croes, Kristof | |
dc.contributor.imecauthor | Adelmann, Christoph | |
dc.contributor.imecauthor | Wilson, Chris | |
dc.contributor.imecauthor | Zahedmanesh, Houman | |
dc.contributor.imecauthor | Varela Pedreira, Olalla | |
dc.contributor.imecauthor | Wu, Chen | |
dc.contributor.imecauthor | Lesniewska, Alicja | |
dc.contributor.imecauthor | Oprins, Herman | |
dc.contributor.imecauthor | Beyne, Sofie | |
dc.contributor.imecauthor | Ciofi, Ivan | |
dc.contributor.imecauthor | Stucchi, Michele | |
dc.contributor.imecauthor | Tokei, Zsolt | |
dc.contributor.orcidimec | Croes, Kristof::0000-0002-3955-0638 | |
dc.contributor.orcidimec | Adelmann, Christoph::0000-0002-4831-3159 | |
dc.contributor.orcidimec | Wu, Chen::0000-0002-4636-8842 | |
dc.contributor.orcidimec | Lesniewska, Alicja::0000-0003-3863-065X | |
dc.contributor.orcidimec | Oprins, Herman::0000-0003-0680-4969 | |
dc.contributor.orcidimec | Ciofi, Ivan::0000-0003-1374-4116 | |
dc.source.peerreview | yes | |
dc.source.beginpage | 111 | |
dc.source.endpage | 114 | |
dc.source.conference | IEEE International Electron Devices Meeting - IEDM | |
dc.source.conferencedate | 1/12/2018 | |
dc.source.conferencelocation | San Fransisco, CA USA | |
dc.identifier.url | https://ieeexplore.ieee.org/document/8614695 | |
imec.availability | Published - imec | |