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Thin film resistivity scaling of metals with conduction band anisotropy

dc.contributor.authorDe Clercq, Miguel
dc.contributor.authorMoors, Kristof
dc.contributor.authorMagnus, Wim
dc.contributor.authorSoree, Bart
dc.date.accessioned2021-10-25T17:38:45Z
dc.date.available2021-10-25T17:38:45Z
dc.date.issued2018
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/30511
dc.sourceIIOimport
dc.titleThin film resistivity scaling of metals with conduction band anisotropy
dc.typeMeeting abstract
dc.contributor.imecauthorMagnus, Wim
dc.contributor.imecauthorSoree, Bart
dc.contributor.orcidimecSoree, Bart::0000-0002-4157-1956
dc.source.peerreviewno
dc.source.beginpageB21.012
dc.source.conferenceAPS March Meeting
dc.source.conferencedate5/03/2018
dc.source.conferencelocationLos Angeles, CA USA
imec.availabilityPublished - imec


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