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Articles
Expected failures in 3D technology and related failure analysis challenges
Publication:
Expected failures in 3D technology and related failure analysis challenges
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Date
2018
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
De Wolf, Ingrid
;
Croes, Kristof
;
Beyne, Eric
Journal
IEEE Transactions on Components, Packaging and Manufacturing Technology
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Acq. date: 2026-01-09
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Views
1828
since deposited on 2021-10-25
1
last month
1
last week
Acq. date: 2026-01-09
Citations