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Expected failures in 3D technology and related failure analysis challenges

dc.contributor.authorDe Wolf, Ingrid
dc.contributor.authorCroes, Kristof
dc.contributor.authorBeyne, Eric
dc.date.accessioned2021-10-25T17:53:11Z
dc.date.available2021-10-25T17:53:11Z
dc.date.issued2018
dc.identifier.issn2156-3950
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/30565
dc.sourceIIOimport
dc.titleExpected failures in 3D technology and related failure analysis challenges
dc.typeJournal article
dc.contributor.imecauthorDe Wolf, Ingrid
dc.contributor.imecauthorCroes, Kristof
dc.contributor.imecauthorBeyne, Eric
dc.contributor.orcidimecDe Wolf, Ingrid::0000-0003-3822-5953
dc.contributor.orcidimecCroes, Kristof::0000-0002-3955-0638
dc.contributor.orcidimecBeyne, Eric::0000-0002-3096-050X
dc.source.peerreviewyes
dc.source.beginpage711
dc.source.endpage718
dc.source.journalIEEE Transactions on Components, Packaging and Manufacturing Technology
dc.source.issue5
dc.source.volume8
dc.identifier.urlhttps://ieeexplore.ieee.org/document/8329133/
imec.availabilityPublished - imec


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