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Assembly-line-compatible electromagnetic characterization of antenna substrates for wearable applications using polynomial chaos

dc.contributor.authorDeckmyn, Thomas
dc.contributor.authorRossi, M.
dc.contributor.authorAgneessens, Sam
dc.contributor.authorRogier, Hendrik
dc.contributor.authorVande Ginste, Dries
dc.date.accessioned2021-10-25T17:55:19Z
dc.date.available2021-10-25T17:55:19Z
dc.date.issued2018
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/30572
dc.sourceIIOimport
dc.titleAssembly-line-compatible electromagnetic characterization of antenna substrates for wearable applications using polynomial chaos
dc.typeProceedings paper
dc.contributor.imecauthorRogier, Hendrik
dc.contributor.imecauthorVande Ginste, Dries
dc.contributor.orcidimecRogier, Hendrik::0000-0001-8139-2736
dc.contributor.orcidimecVande Ginste, Dries::0000-0002-0178-288X
dc.date.embargo9999-12-31
dc.source.peerreviewyes
dc.source.beginpage1
dc.source.endpage4
dc.source.conferenceIEEE MTT-S International Conference on Numerical Electromagnetic and Multiphysics Modeling and Optimization - NEMO2018
dc.source.conferencedate8/08/2018
dc.source.conferencelocationReykjavik Iceland
dc.identifier.urlhttps://ieeexplore.ieee.org/document/8503496
imec.availabilityPublished - open access
imec.internalnotesISBN 978-1-5386-5204-6


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