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DLTS of Si and Ge nanodots embedded in SiO2

dc.contributor.authorDefreyne, Lies
dc.contributor.authorAouassa, Mansour
dc.contributor.authorVrielinck, Henk
dc.contributor.authorSimoen, Eddy
dc.date.accessioned2021-10-25T17:57:01Z
dc.date.available2021-10-25T17:57:01Z
dc.date.issued2018
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/30578
dc.sourceIIOimport
dc.titleDLTS of Si and Ge nanodots embedded in SiO2
dc.typeMeeting abstract
dc.contributor.imecauthorSimoen, Eddy
dc.contributor.orcidimecSimoen, Eddy::0000-0002-5218-4046
dc.source.peerreviewno
dc.source.beginpageI.14.4
dc.source.conferenceEuropean MRS Spring Meeting Symposium I: Materials Research for Group IV Semiconductors: Growth, Characterization and ...
dc.source.conferencedate18/06/2018
dc.source.conferencelocationStrasbourg France
imec.availabilityPublished - imec


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