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Toward a reference sample for atom probe tomography

dc.contributor.authorDialameh, Masoud
dc.contributor.authorFleischmann, Claudia
dc.contributor.authorBogdanowicz, Janusz
dc.contributor.authorDe Leo, Natascia
dc.contributor.authorBoaribo, Luca
dc.contributor.authorVandervorst, Wilfried
dc.date.accessioned2021-10-25T18:15:07Z
dc.date.available2021-10-25T18:15:07Z
dc.date.issued2018
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/30635
dc.sourceIIOimport
dc.titleToward a reference sample for atom probe tomography
dc.typeProceedings paper
dc.contributor.imecauthorFleischmann, Claudia
dc.contributor.imecauthorBogdanowicz, Janusz
dc.contributor.imecauthorVandervorst, Wilfried
dc.contributor.orcidimecFleischmann, Claudia::0000-0003-1531-6916
dc.contributor.orcidimecBogdanowicz, Janusz::0000-0002-7503-8922
dc.source.peerreviewyes
dc.source.conferenceWorkshop on Reference Nanomaterials: Current Situation and Needs: Development, Measurement, Standardization
dc.source.conferencedate14/05/2018
dc.source.conferencelocationBerlin, Germany
imec.availabilityPublished - imec


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