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4 $p microscopy immune to sample-induced dephasing

dc.contributor.authorDiaz Tormo, Alejandro
dc.contributor.authorKhalenkow, Dmitry
dc.contributor.authorSkirtach, Andre G.
dc.contributor.authorLe Thomas, Nicolas
dc.date.accessioned2021-10-25T18:16:03Z
dc.date.available2021-10-25T18:16:03Z
dc.date.issued2018
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/30638
dc.sourceIIOimport
dc.title4 $p microscopy immune to sample-induced dephasing
dc.typeProceedings paper
dc.contributor.imecauthorDiaz Tormo, Alejandro
dc.contributor.imecauthorLe Thomas, Nicolas
dc.date.embargo9999-12-31
dc.source.peerreviewyes
dc.source.beginpage259
dc.source.endpage260
dc.source.conferenceIEEE Photonics Conference - IPC
dc.source.conferencedate30/09/2018
dc.source.conferencelocationReston, VA USA
dc.identifier.urlhttps://ieeexplore.ieee.org/document/8527189
imec.availabilityPublished - open access
imec.internalnotesISBN 978-1-5386-4082-1


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