Authors

Van Olmen, Jan; Manca, Jean; De Ceuninck, Ward; De Schepper, Luc; D'Haeger, V.; Witvrouw, Ann; Maex, Karen

Conference

Proceedings of the 9th European Symposium on Reliability of Electron Devices and Failure Physics - ESREF

Title

Overview of the kinetics of the early stages of electromigration under low (=realistic) current density stress

Publication type

Proceedings paper

Embargo date

9999-12-31