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Impact of stress on MOS devices

dc.contributor.authorEneman, Geert
dc.date.accessioned2021-10-25T18:29:45Z
dc.date.available2021-10-25T18:29:45Z
dc.date.issued2018
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/30680
dc.sourceIIOimport
dc.titleImpact of stress on MOS devices
dc.typeOral presentation
dc.contributor.imecauthorEneman, Geert
dc.contributor.orcidimecEneman, Geert::0000-0002-5849-3384
dc.source.peerreviewno
dc.source.conferenceEuropean Conference on Residual Stresses - ECRS10
dc.source.conferencedate10/09/2018
dc.source.conferencelocationLeuven Belgium
imec.availabilityPublished - imec


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