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Single atom detection from low contrast-to-noise ratio electron microscopy images

dc.contributor.authorFatermans, J.
dc.contributor.authorden Dekker, Arnold Jan
dc.contributor.authorMüller-Caspary, K.
dc.contributor.authorLobato, Ivan
dc.contributor.authorO'Leary, C. M.
dc.contributor.authorNellist, Peter D.
dc.contributor.authorVan Aert, Sandra
dc.date.accessioned2021-10-25T18:34:45Z
dc.date.available2021-10-25T18:34:45Z
dc.date.issued2018-07
dc.identifier.issn0031-9007
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/30695
dc.sourceIIOimport
dc.titleSingle atom detection from low contrast-to-noise ratio electron microscopy images
dc.typeJournal article
dc.source.peerreviewyes
dc.source.beginpage56101
dc.source.journalPhysical Review Letters
dc.source.issue5
dc.source.volume121
dc.identifier.urlhttps://journals.aps.org/prl/abstract/10.1103/PhysRevLett.121.056101
imec.availabilityPublished - imec


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