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Investigation of the endurance of FE-HfO2 devices by means of TDDB studies
Publication:
Investigation of the endurance of FE-HfO2 devices by means of TDDB studies
Date
2018
Proceedings Paper
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Florent, Karine
;
Subirats, Alexandre
;
Lavizzari, Simone
;
Degraeve, Robin
;
Celano, Umberto
;
Kaczer, Ben
;
Di Piazza, Luca
;
Popovici, Mihaela Ioana
;
Groeseneken, Guido
;
Van Houdt, Jan
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1919
since deposited on 2021-10-25
Acq. date: 2025-10-23
Citations
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1919
since deposited on 2021-10-25
Acq. date: 2025-10-23
Citations