Investigation of the endurance of FE-HfO2 devices by means of TDDB studies

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Authors
Florent, Karine; Subirats, Alexandre; Lavizzari, Simone; Degraeve, Robin; Celano, Umberto; Kaczer, Ben; Di Piazza, Luca; Popovici, Mihaela Ioana; Groeseneken, Guido; Van Houdt, Jan
Conference
IEEE International Reliability Physics Symposium - IRPS
Title
Investigation of the endurance of FE-HfO2 devices by means of TDDB studies
Publication type
Proceedings paper
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