dc.contributor.author | Folkersma, Steven | |
dc.contributor.author | Bogdanowicz, Janusz | |
dc.contributor.author | Schulze, Andreas | |
dc.contributor.author | Favia, Paola | |
dc.contributor.author | Dirch, Petersen | |
dc.contributor.author | Ole, Hansen | |
dc.contributor.author | Henrik, Henrichsen | |
dc.contributor.author | Nielsen, Peter | |
dc.contributor.author | Shiv, Lior | |
dc.contributor.author | Vandervorst, Wilfried | |
dc.date.accessioned | 2021-10-25T18:43:15Z | |
dc.date.available | 2021-10-25T18:43:15Z | |
dc.date.issued | 2018 | |
dc.identifier.issn | 2190-4286 | |
dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/30719 | |
dc.source | IIOimport | |
dc.title | Electrical characterization of single nanometer-wide Si fins in dense arrays | |
dc.type | Journal article | |
dc.contributor.imecauthor | Folkersma, Steven | |
dc.contributor.imecauthor | Bogdanowicz, Janusz | |
dc.contributor.imecauthor | Favia, Paola | |
dc.contributor.imecauthor | Vandervorst, Wilfried | |
dc.contributor.orcidimec | Bogdanowicz, Janusz::0000-0002-7503-8922 | |
dc.contributor.orcidimec | Favia, Paola::0000-0002-1019-3497 | |
dc.source.peerreview | yes | |
dc.source.beginpage | 1863 | |
dc.source.endpage | 1867 | |
dc.source.journal | Beilstein Journal of Nanotechnology | |
dc.source.volume | 9 | |
dc.identifier.url | https://www.beilstein-journals.org/bjnano/articles/9/178 | |
imec.availability | Published - imec | |