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Defect evaluation in strain-relaxed Ge0.947Sn0.053 grown on (001) Si

dc.contributor.authorGupta, Somya
dc.contributor.authorShimura, Yosuke
dc.contributor.authorRichard, Olivier
dc.contributor.authorDouhard, Bastien
dc.contributor.authorSimoen, Eddy
dc.contributor.authorBender, Hugo
dc.contributor.authorNakatsuka, Osama
dc.contributor.authorZaima, Shigeaki
dc.contributor.authorLoo, Roger
dc.contributor.authorHeyns, Marc
dc.date.accessioned2021-10-25T19:24:17Z
dc.date.available2021-10-25T19:24:17Z
dc.date.issued2018-10
dc.identifier.issn0003-6951
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/30827
dc.sourceIIOimport
dc.titleDefect evaluation in strain-relaxed Ge0.947Sn0.053 grown on (001) Si
dc.typeJournal article
dc.contributor.imecauthorRichard, Olivier
dc.contributor.imecauthorDouhard, Bastien
dc.contributor.imecauthorSimoen, Eddy
dc.contributor.imecauthorBender, Hugo
dc.contributor.imecauthorLoo, Roger
dc.contributor.imecauthorHeyns, Marc
dc.contributor.orcidimecRichard, Olivier::0000-0002-3994-8021
dc.contributor.orcidimecSimoen, Eddy::0000-0002-5218-4046
dc.contributor.orcidimecLoo, Roger::0000-0003-3513-6058
dc.source.peerreviewyes
dc.source.beginpage192103
dc.source.journalApplied Physics Letters
dc.source.issue19
dc.source.volume113
dc.identifier.urlhttps://doi.org/10.1063/1.5048683
imec.availabilityPublished - imec


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