Publication:

Defect evaluation in strain-relaxed Ge0.947Sn0.053 grown on (001) Si

Date

2018-10

Journal article

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Author(s)

;

Shimura, Yosuke

;

Richard, Olivier

;

Douhard, Bastien

;

;

;

Nakatsuka, Osama

;

Zaima, Shigeaki

;

;

Journal

Applied Physics Letters

Statistics

1918 since deposited on 2021-10-25

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Acq. date: 2026-02-26