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Defect evaluation in strain-relaxed Ge0.947Sn0.053 grown on (001) Si
Publication:
Defect evaluation in strain-relaxed Ge0.947Sn0.053 grown on (001) Si
Date
2018-10
Journal article
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Gupta, Somya
;
Shimura, Yosuke
;
Richard, Olivier
;
Douhard, Bastien
;
Simoen, Eddy
;
Bender, Hugo
;
Nakatsuka, Osama
;
Zaima, Shigeaki
;
Loo, Roger
;
Heyns, Marc
Journal
Applied Physics Letters
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1916
since deposited on 2021-10-25
Acq. date: 2025-12-08
Citations
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Views
1916
since deposited on 2021-10-25
Acq. date: 2025-12-08
Citations