Electrical properties of extended defects in strain relaxed GeSn

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Authors

Gupta, Somya; Simoen, Eddy; Loo, Roger; Shimura, Yosuke; Gencarelli, Federica; Wouters, Lennaert; Paredis, Kristof; Bender, Hugo; Vrielink, Henk; Heyns, Marc

ISSN

0003-6951

Issue

2

Journal

Applied Physics Letters

Volume

113

Title

Electrical properties of extended defects in strain relaxed GeSn

Publication type

Journal article

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