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Electrical properties of extended defects in strain relaxed GeSn

dc.contributor.authorGupta, Somya
dc.contributor.authorSimoen, Eddy
dc.contributor.authorLoo, Roger
dc.contributor.authorShimura, Yosuke
dc.contributor.authorGencarelli, Federica
dc.contributor.authorWouters, Lennaert
dc.contributor.authorParedis, Kristof
dc.contributor.authorBender, Hugo
dc.contributor.authorVrielink, Henk
dc.contributor.authorHeyns, Marc
dc.date.accessioned2021-10-25T19:24:43Z
dc.date.available2021-10-25T19:24:43Z
dc.date.issued2018
dc.identifier.issn0003-6951
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/30828
dc.sourceIIOimport
dc.titleElectrical properties of extended defects in strain relaxed GeSn
dc.typeJournal article
dc.contributor.imecauthorSimoen, Eddy
dc.contributor.imecauthorLoo, Roger
dc.contributor.imecauthorWouters, Lennaert
dc.contributor.imecauthorParedis, Kristof
dc.contributor.imecauthorBender, Hugo
dc.contributor.imecauthorHeyns, Marc
dc.contributor.orcidimecSimoen, Eddy::0000-0002-5218-4046
dc.contributor.orcidimecLoo, Roger::0000-0003-3513-6058
dc.contributor.orcidimecWouters, Lennaert::0000-0002-6730-9542
dc.contributor.orcidimecParedis, Kristof::0000-0002-5163-4164
dc.source.peerreviewyes
dc.source.beginpage22102
dc.source.journalApplied Physics Letters
dc.source.issue2
dc.source.volume113
dc.identifier.urlhttps://aip.scitation.org/doi/10.1063/1.5034573
imec.availabilityPublished - imec


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