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Review-SEM image analysis with K-means algorithm

dc.contributor.authorHalder, Sandip
dc.contributor.authorCerbu, Dorin
dc.contributor.authorSaib, Mohamed
dc.contributor.authorLeray, Philippe
dc.date.accessioned2021-10-25T19:28:24Z
dc.date.available2021-10-25T19:28:24Z
dc.date.issued2018
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/30838
dc.sourceIIOimport
dc.titleReview-SEM image analysis with K-means algorithm
dc.typeProceedings paper
dc.contributor.imecauthorHalder, Sandip
dc.contributor.imecauthorCerbu, Dorin
dc.contributor.imecauthorSaib, Mohamed
dc.contributor.imecauthorLeray, Philippe
dc.contributor.orcidimecHalder, Sandip::0000-0002-6314-2685
dc.date.embargo9999-12-31
dc.source.peerreviewyes
dc.source.beginpage255
dc.source.endpage258
dc.source.conference29th Annual SEMI Advanced Semiconductor Manufacturing Conference (ASMC)
dc.source.conferencedate28/04/2018
dc.source.conferencelocationSaratoga Springs, NY USA
dc.identifier.urlhttps://ieeexplore.ieee.org/document/8373221
imec.availabilityPublished - open access


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