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Statistical modeling based on extensive TCAD simulations. Proposed methodology for extraction of fast/slow models and statististical models

dc.contributor.authorVandenbossche, E.
dc.contributor.authorKopalidis, George
dc.contributor.authorTack, Marnix
dc.contributor.authorSchoenmaker, Wim
dc.date.accessioned2021-10-01T09:28:06Z
dc.date.available2021-10-01T09:28:06Z
dc.date.issued1998
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/3084
dc.sourceIIOimport
dc.titleStatistical modeling based on extensive TCAD simulations. Proposed methodology for extraction of fast/slow models and statististical models
dc.typeProceedings paper
dc.date.embargo9999-12-31
dc.source.peerreviewno
dc.source.beginpage85
dc.source.endpage88
dc.source.conferenceSimulation of Semiconductor Processes and Devices 1998 - SISPAD 98
dc.source.conferencedate2/09/1998
dc.source.conferencelocationLeuven Belgium
imec.availabilityPublished - open access


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