Characterization by GISAXS and electrochemical impedance spectroscopy of porous oxide films

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Authors
Huanca, Danilo; Verdonck, Patrick; Dias, Carlos; Petersen Barbosa Lima, Lucas; Van Elshocht, Sven; dos Santos, Sebastiao; Witters, Thomas
Conference
33rd Symposium on Microelectronics Technology and Devices - SBMicro
Title
Characterization by GISAXS and electrochemical impedance spectroscopy of porous oxide films
Publication type
Proceedings paper
Embargo date
9999-12-31
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