dc.contributor.author | Huynen, Martijn | |
dc.contributor.author | De Zutter, Daniel | |
dc.contributor.author | Vande Ginste, Dries | |
dc.date.accessioned | 2021-10-25T20:07:05Z | |
dc.date.available | 2021-10-25T20:07:05Z | |
dc.date.issued | 2018 | |
dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/30931 | |
dc.source | IIOimport | |
dc.title | Broadband full-wave BIE impedance characterizaion of 3-D Interconnects | |
dc.type | Proceedings paper | |
dc.contributor.imecauthor | Huynen, Martijn | |
dc.contributor.imecauthor | De Zutter, Daniel | |
dc.contributor.imecauthor | Vande Ginste, Dries | |
dc.contributor.orcidimec | Huynen, Martijn::0000-0002-5168-9421 | |
dc.contributor.orcidimec | Vande Ginste, Dries::0000-0002-0178-288X | |
dc.date.embargo | 9999-12-31 | |
dc.source.peerreview | yes | |
dc.source.beginpage | 241 | |
dc.source.endpage | 243 | |
dc.source.conference | IEEE 27th Conference on Electrical Performance of Electronic Packaging and Systems EPEPS | |
dc.source.conferencedate | 14/10/2018 | |
dc.source.conferencelocation | San Jose, CA USA | |
dc.identifier.url | https://ieeexplore.ieee.org/document/8534300 | |
imec.availability | Published - open access | |
imec.internalnotes | ISBN 978-1-5386-5166-7 | |