Show simple item record

Neural network Hilbert transform based filtered backprojection for fast inline x-ray inspection

dc.contributor.authorJanssens, Eline
dc.contributor.authorDe Beenhouwer, Jan
dc.contributor.authorVan Dael, Mattias
dc.contributor.authorDe Schryver, Thomas
dc.contributor.authorVan Hoorebeke, Luc
dc.contributor.authorVerboven, Pieter
dc.contributor.authorNicolai, Bart
dc.contributor.authorSijbers, Jan
dc.date.accessioned2021-10-25T20:20:12Z
dc.date.available2021-10-25T20:20:12Z
dc.date.issued2018
dc.identifier.issn0957-0233
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/30961
dc.sourceIIOimport
dc.titleNeural network Hilbert transform based filtered backprojection for fast inline x-ray inspection
dc.typeJournal article
dc.contributor.imecauthorDe Beenhouwer, Jan
dc.contributor.imecauthorSijbers, Jan
dc.contributor.orcidimecDe Beenhouwer, Jan::0000-0001-5253-1274
dc.contributor.orcidimecSijbers, Jan::0000-0003-4225-2487
dc.source.peerreviewyes
dc.source.beginpage34012
dc.source.journalMeasurement Science and Technology
dc.source.issue3
dc.source.volume29
dc.identifier.urlhttp://iopscience.iop.org/article/10.1088/1361-6501/aa9de3/meta
imec.availabilityPublished - imec


Files in this item

FilesSizeFormatView

There are no files associated with this item.

This item appears in the following collection(s)

Show simple item record