Authors

Janssens, Eline; De Beenhouwer, Jan; Van Dael, Mattias; De Schryver, Thomas; Van Hoorebeke, Luc; Verboven, Pieter; Nicolai, Bart; Sijbers, Jan

ISSN

0957-0233

Issue

3

Journal

Measurement Science and Technology

Volume

29

Title

Neural network Hilbert transform based filtered backprojection for fast inline x-ray inspection

Publication type

Journal article