Neural network Hilbert transform based filtered backprojection for fast inline x-ray inspection

dc.contributor.author	Janssens, Eline
dc.contributor.author	De Beenhouwer, Jan
dc.contributor.author	Van Dael, Mattias
dc.contributor.author	De Schryver, Thomas
dc.contributor.author	Van Hoorebeke, Luc
dc.contributor.author	Verboven, Pieter
dc.contributor.author	Nicolai, Bart
dc.contributor.author	Sijbers, Jan
dc.contributor.imecauthor	De Beenhouwer, Jan
dc.contributor.imecauthor	Sijbers, Jan
dc.contributor.orcidimec	De Beenhouwer, Jan::0000-0001-5253-1274
dc.contributor.orcidimec	Sijbers, Jan::0000-0003-4225-2487
dc.date.accessioned	2021-10-25T20:20:12Z
dc.date.available	2021-10-25T20:20:12Z
dc.date.issued	2018
dc.identifier.issn	0957-0233
dc.identifier.uri	https://imec-publications.be/handle/20.500.12860/30961
dc.identifier.url	http://iopscience.iop.org/article/10.1088/1361-6501/aa9de3/meta
dc.source.beginpage	34012
dc.source.issue	3
dc.source.journal	Measurement Science and Technology
dc.source.volume	29
dc.title	Neural network Hilbert transform based filtered backprojection for fast inline x-ray inspection
dc.type	Journal article
dspace.entity.type	Publication
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