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Articles
Neural network Hilbert transform based filtered backprojection for fast inline x-ray inspection
Publication:
Neural network Hilbert transform based filtered backprojection for fast inline x-ray inspection
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Date
2018
Journal article
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Janssens, Eline
;
De Beenhouwer, Jan
;
Van Dael, Mattias
;
De Schryver, Thomas
;
Van Hoorebeke, Luc
;
Verboven, Pieter
;
Nicolai, Bart
;
Sijbers, Jan
Journal
Measurement Science and Technology
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1982
since deposited on 2021-10-25
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last month
Acq. date: 2025-12-12
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Metrics
Views
1982
since deposited on 2021-10-25
1
last month
Acq. date: 2025-12-12
Citations