Skip to content
Institutional repository
Communities & Collections
Browse
Site
Log In
imec Publications
Articles
Neural network Hilbert transform based filtered backprojection for fast inline x-ray inspection
Publication:
Neural network Hilbert transform based filtered backprojection for fast inline x-ray inspection
Date
2018
Journal article
Simple item page
Full metadata
Statistics
Loading...
Loading...
Basic data
APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Janssens, Eline
;
De Beenhouwer, Jan
;
Van Dael, Mattias
;
De Schryver, Thomas
;
Van Hoorebeke, Luc
;
Verboven, Pieter
;
Nicolai, Bart
;
Sijbers, Jan
Journal
Measurement Science and Technology
Abstract
Description
Metrics
Views
1980
since deposited on 2021-10-25
409
item.page.metrics.field.last-week
Acq. date: 2025-10-25
Citations
Metrics
Views
1980
since deposited on 2021-10-25
409
item.page.metrics.field.last-week
Acq. date: 2025-10-25
Citations