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Single event latch-up: increased sensitivity from planar to FinFET

dc.contributor.authorKarp, James
dc.contributor.authorHart, Michael J.
dc.contributor.authorMaillard, Pierre
dc.contributor.authorHellings, Geert
dc.contributor.authorLinten, Dimitri
dc.date.accessioned2021-10-25T20:45:54Z
dc.date.available2021-10-25T20:45:54Z
dc.date.issued2018
dc.identifier.issn0018-9499
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/31019
dc.sourceIIOimport
dc.titleSingle event latch-up: increased sensitivity from planar to FinFET
dc.typeJournal article
dc.contributor.imecauthorHellings, Geert
dc.contributor.imecauthorLinten, Dimitri
dc.contributor.orcidimecHellings, Geert::0000-0002-5376-2119
dc.contributor.orcidimecLinten, Dimitri::0000-0001-8434-1838
dc.source.peerreviewyes
dc.source.beginpage217
dc.source.endpage222
dc.source.journalIEEE Transactions on Nuclear Science
dc.source.issue1
dc.source.volume65
dc.identifier.urlhttp://ieeexplore.ieee.org/document/8141939/
imec.availabilityPublished - imec


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