Single event latch-up: increased sensitivity from planar to FinFET

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Authors

Karp, James; Hart, Michael J.; Maillard, Pierre; Hellings, Geert; Linten, Dimitri

ISSN

0018-9499

Issue

1

Journal

IEEE Transactions on Nuclear Science

Volume

65

Title

Single event latch-up: increased sensitivity from planar to FinFET

Publication type

Journal article

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