Publication:
Single event latch-up: increased sensitivity from planar to FinFET
Date
| dc.contributor.author | Karp, James | |
| dc.contributor.author | Hart, Michael J. | |
| dc.contributor.author | Maillard, Pierre | |
| dc.contributor.author | Hellings, Geert | |
| dc.contributor.author | Linten, Dimitri | |
| dc.contributor.imecauthor | Hellings, Geert | |
| dc.contributor.imecauthor | Linten, Dimitri | |
| dc.contributor.orcidimec | Hellings, Geert::0000-0002-5376-2119 | |
| dc.contributor.orcidimec | Linten, Dimitri::0000-0001-8434-1838 | |
| dc.date.accessioned | 2021-10-25T20:45:54Z | |
| dc.date.available | 2021-10-25T20:45:54Z | |
| dc.date.issued | 2018 | |
| dc.identifier.issn | 0018-9499 | |
| dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/31019 | |
| dc.identifier.url | http://ieeexplore.ieee.org/document/8141939/ | |
| dc.source.beginpage | 217 | |
| dc.source.endpage | 222 | |
| dc.source.issue | 1 | |
| dc.source.journal | IEEE Transactions on Nuclear Science | |
| dc.source.volume | 65 | |
| dc.title | Single event latch-up: increased sensitivity from planar to FinFET | |
| dc.type | Journal article | |
| dspace.entity.type | Publication | |
| Files | ||
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