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Embedded toggle generator to provide realistic test conditions during test of digital 2D-SoCs and 3D-SICs

dc.contributor.authorKatselas, Leonidas
dc.contributor.authorHatzopoulos, Alkis
dc.contributor.authorJiao, Hailong
dc.contributor.authorPapameletis, Christos
dc.contributor.authorMarinissen, Erik Jan
dc.date.accessioned2021-10-25T20:47:12Z
dc.date.available2021-10-25T20:47:12Z
dc.date.issued2018-05
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/31022
dc.sourceIIOimport
dc.titleEmbedded toggle generator to provide realistic test conditions during test of digital 2D-SoCs and 3D-SICs
dc.typeProceedings paper
dc.contributor.imecauthorKatselas, Leonidas
dc.contributor.imecauthorMarinissen, Erik Jan
dc.contributor.orcidimecMarinissen, Erik Jan::0000-0002-5058-8303
dc.source.peerreviewyes
dc.source.conferenceCDN Live EMEA 2018
dc.source.conferencedate7/05/2018
dc.source.conferencelocationMunich Germany
dc.identifier.urlhttps://www.cadence.com/content/cadence-www/global/en_US/home/cdnlive/emea-2018/proceedings.html
imec.availabilityPublished - imec


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