Authors

Katselas, Leonidas; Hatzopoulos, Alkis; Jiao, Hailong; Papameletis, Christos; Marinissen, Erik Jan

Conference

IEEE International Test Conference - ITC'18

Title

On-chip toggle generators to provide realistic conditions during test of digital 2D-SoCs and 3D-SICs

Publication type

Proceedings paper

Embargo date

9999-12-31