A low-frequency noise study of hot-carrier stressing effects in submicron Si p-MOSFETs
dc.contributor.author | Vasina, Petr | |
dc.contributor.author | Simoen, Eddy | |
dc.contributor.author | Claeys, Cor | |
dc.contributor.author | Sikula, J. | |
dc.date.accessioned | 2021-10-01T09:34:09Z | |
dc.date.available | 2021-10-01T09:34:09Z | |
dc.date.issued | 1998 | |
dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/3106 | |
dc.source | IIOimport | |
dc.title | A low-frequency noise study of hot-carrier stressing effects in submicron Si p-MOSFETs | |
dc.type | Journal article | |
dc.contributor.imecauthor | Simoen, Eddy | |
dc.contributor.orcidimec | Simoen, Eddy::0000-0002-5218-4046 | |
dc.date.embargo | 9999-12-31 | |
dc.source.peerreview | no | |
dc.source.beginpage | 23 | |
dc.source.endpage | 27 | |
dc.source.journal | Microelectronics Reliability | |
dc.source.issue | 1 | |
dc.source.volume | 38 | |
imec.availability | Published - open access |