Publication:
A low-frequency noise study of hot-carrier stressing effects in submicron Si p-MOSFETs
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1958 since deposited on 2021-10-01
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Acq. date: 2025-12-08
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1958 since deposited on 2021-10-01
1last month
1last week
Acq. date: 2025-12-08
Citations