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A low-frequency noise study of hot-carrier stressing effects in submicron Si p-MOSFETs
Publication:
A low-frequency noise study of hot-carrier stressing effects in submicron Si p-MOSFETs
Date
1998
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Basic data
APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Vasina, Petr
;
Simoen, Eddy
;
Claeys, Cor
;
Sikula, J.
Journal
Microelectronics Reliability
Abstract
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1955
since deposited on 2021-10-01
Acq. date: 2025-10-23
Citations
Metrics
Views
1955
since deposited on 2021-10-01
Acq. date: 2025-10-23
Citations