A low-frequency noise study of hot-carrier stressing effects in submicron Si p-MOSFETs

dc.contributor.author	Vasina, Petr
dc.contributor.author	Simoen, Eddy
dc.contributor.author	Claeys, Cor
dc.contributor.author	Sikula, J.
dc.contributor.imecauthor	Simoen, Eddy
dc.contributor.orcidimec	Simoen, Eddy::0000-0002-5218-4046
dc.date.accessioned	2021-10-01T09:34:09Z
dc.date.available	2021-10-01T09:34:09Z
dc.date.embargo	9999-12-31
dc.date.issued	1998
dc.identifier.uri	https://imec-publications.be/handle/20.500.12860/3106
dc.source.beginpage	23
dc.source.endpage	27
dc.source.issue	1
dc.source.journal	Microelectronics Reliability
dc.source.volume	38
dc.title	A low-frequency noise study of hot-carrier stressing effects in submicron Si p-MOSFETs
dc.type	Journal article
dspace.entity.type	Publication
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