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dc.contributor.authorKorneychuk, S.
dc.contributor.authorPartoens, B.
dc.contributor.authorGuzzinati, G.
dc.contributor.authorRamaneti, Rajesh
dc.contributor.authorDerluyn, J.
dc.contributor.authorHaenen, Ken
dc.contributor.authorVerbeeck, J.
dc.date.accessioned2021-10-25T21:12:11Z
dc.date.available2021-10-25T21:12:11Z
dc.date.issued2018
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/31077
dc.sourceIIOimport
dc.titleExploring possibilities of band gap measurements with off-axis EELS in TEM
dc.typeOral presentation
dc.contributor.imecauthorHaenen, Ken
dc.contributor.orcidimecHaenen, Ken::0000-0001-6711-7367
dc.source.peerreviewno
dc.source.conferenceHasselt Diamond Workshop 2018 - SBDD XXIII
dc.source.conferencedate7/03/2018
dc.source.conferencelocationHasselt Belgium
imec.availabilityPublished - imec


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