Exploring possibilities of band gap measurement with off-axis EELS in TEM

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Authors
Korneychuk, Svetlana; Partoens, Bart; Guzzinati, Giulio; Ramaneti, Rajesh; Derluyn, Joff; Haenen, Ken; Verbeeck, Jo
ISSN
0304-3991
Journal
Ultramicroscopy
Volume
189
Title
Exploring possibilities of band gap measurement with off-axis EELS in TEM
Publication type
Journal article
Embargo date
9999-12-31
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