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Exploring possibilities of band gap measurement with off-axis EELS in TEM

dc.contributor.authorKorneychuk, Svetlana
dc.contributor.authorPartoens, Bart
dc.contributor.authorGuzzinati, Giulio
dc.contributor.authorRamaneti, Rajesh
dc.contributor.authorDerluyn, Joff
dc.contributor.authorHaenen, Ken
dc.contributor.authorVerbeeck, Jo
dc.date.accessioned2021-10-25T21:12:39Z
dc.date.available2021-10-25T21:12:39Z
dc.date.issued2018
dc.identifier.issn0304-3991
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/31078
dc.sourceIIOimport
dc.titleExploring possibilities of band gap measurement with off-axis EELS in TEM
dc.typeJournal article
dc.contributor.imecauthorHaenen, Ken
dc.contributor.orcidimecHaenen, Ken::0000-0001-6711-7367
dc.date.embargo9999-12-31
dc.source.peerreviewyes
dc.source.beginpage76
dc.source.endpage84
dc.source.journalUltramicroscopy
dc.source.volume189
dc.identifier.urlhttps://www.sciencedirect.com/science/article/pii/S0304399117304229
imec.availabilityPublished - open access


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