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Degradation analysis of high performance 14nm FinFET SRAM

dc.contributor.authorKraak, Daniel
dc.contributor.authorAgbo, Innocent
dc.contributor.authorTaouil, Motta
dc.contributor.authorHamdioui, Said
dc.contributor.authorWeckx, Pieter
dc.contributor.authorCosemans, Stefan
dc.contributor.authorCatthoor, Francky
dc.date.accessioned2021-10-25T21:14:29Z
dc.date.available2021-10-25T21:14:29Z
dc.date.issued2018
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/31082
dc.sourceIIOimport
dc.titleDegradation analysis of high performance 14nm FinFET SRAM
dc.typeProceedings paper
dc.contributor.imecauthorWeckx, Pieter
dc.contributor.imecauthorCosemans, Stefan
dc.contributor.imecauthorCatthoor, Francky
dc.contributor.orcidimecCatthoor, Francky::0000-0002-3599-8515
dc.date.embargo9999-12-31
dc.source.peerreviewyes
dc.source.beginpage201
dc.source.endpage206
dc.source.conference21th ACM/IEEE Design and Test in Europe Conference- DATE
dc.source.conferencedate19/03/2018
dc.source.conferencelocationDresden Germany
imec.availabilityPublished - open access


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