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Device aging: A reliability and security concern

dc.contributor.authorKraak, Daniel
dc.contributor.authorMottaqiallah, Taouil
dc.contributor.authorHamdioui, Said
dc.contributor.authorWeckx, Pieter
dc.contributor.authorCatthoor, Francky
dc.contributor.authorChatterjee, Abhijit
dc.contributor.authorSingh, Adit
dc.contributor.authorWunderlich, Joachim
dc.contributor.authorKarimi, Naghmeh
dc.date.accessioned2021-10-25T21:14:59Z
dc.date.available2021-10-25T21:14:59Z
dc.date.issued2018
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/31083
dc.sourceIIOimport
dc.titleDevice aging: A reliability and security concern
dc.typeProceedings paper
dc.contributor.imecauthorWeckx, Pieter
dc.contributor.imecauthorCatthoor, Francky
dc.contributor.orcidimecCatthoor, Francky::0000-0002-3599-8515
dc.date.embargo9999-12-31
dc.source.peerreviewyes
dc.source.beginpage1
dc.source.endpage10
dc.source.conferenceIEEE 23rd European Test Symposium (ETS)
dc.source.conferencedate28/05/2018
dc.source.conferencelocationBremen Germany
dc.identifier.urlhttps://ieeexplore.ieee.org/document/8400702
imec.availabilityPublished - open access


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