A circuit modeling technique for the ISO 7637-3 capacitive coupling clamp test

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Authors

Lambrecht, Niels; Pues, H.; De Zutter, Daniel; Vande Ginste, Dries

ISSN

0018-9375

Issue

4

Journal

IEEE Transactions on Electromagnetic Compatibility

Volume

60

Title

A circuit modeling technique for the ISO 7637-3 capacitive coupling clamp test

Publication type

Journal article

Embargo date

9999-12-31

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