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A circuit modeling technique for the ISO 7637-3 capacitive coupling clamp test

dc.contributor.authorLambrecht, Niels
dc.contributor.authorPues, H.
dc.contributor.authorDe Zutter, Daniel
dc.contributor.authorVande Ginste, Dries
dc.date.accessioned2021-10-25T21:27:40Z
dc.date.available2021-10-25T21:27:40Z
dc.date.issued2018-08
dc.identifier.issn0018-9375
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/31110
dc.sourceIIOimport
dc.titleA circuit modeling technique for the ISO 7637-3 capacitive coupling clamp test
dc.typeJournal article
dc.contributor.imecauthorDe Zutter, Daniel
dc.contributor.imecauthorVande Ginste, Dries
dc.contributor.orcidimecVande Ginste, Dries::0000-0002-0178-288X
dc.date.embargo9999-12-31
dc.source.peerreviewyes
dc.source.beginpage858
dc.source.endpage865
dc.source.journalIEEE Transactions on Electromagnetic Compatibility
dc.source.issue4
dc.source.volume60
dc.identifier.urlhttp://ieeexplore.ieee.org/document/8097033/
imec.availabilityPublished - open access


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